QUEBEC CITY – EXFO Inc. said Tuesday that it has released the fastest test system for insertion loss (IL) and return loss (RL) measurement for a variety of passive components, including photonics integrated circuits.With the increasing demand for photonics integrated circuits composed of hundreds of passive components plus pressure to reduce network equipment costs, passive component manufacturers are looking for effective testing solutions to reduce their testing time without sacrificing accuracy and reliability, the network test and monitoring technology maker said. The CTP10 Component Test Platform can measure IL and RL in a single sweep up to 1000 nm/s."EXFO's CTP10...
