QUEBEC CITY – EXFO Inc. said Tuesday that it has released the fastest test system for insertion loss (IL) and return loss (RL) measurement for a variety of passive components, including photonics integrated circuits.
With the increasing demand for photonics integrated circuits composed of hundreds of passive components plus pressure to reduce network equipment costs, passive component manufacturers are looking for effective testing solutions to reduce their testing time without sacrificing accuracy and reliability, the network test and monitoring technology maker said. The CTP10 Component Test Platform can measure IL and RL in a single sweep up to 1000 nm/s.
"EXFO's CTP10 offers R&D and manufacturing teams working with photonics integrated circuits and next-generation passive optical network components the flexibility, accuracy and speed they need to test thousands of components as required by their customers", said EXFO's test and measurement VP Stéphane Chabot, in the news release.
This new product grew from the company's recent purchase of Yenista Optics, where "the objective was to leverage their expertise to bring some of the most innovative testing solutions for the optical telecom industry," added Chabot.
